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104 MoldMaking Technology July 2015 Inspection/Measurement Probe Inspects Surface Finish within CMM Routines The SFP1 probe option for Renishaw's Revo five-axis measurement system enables surface finish inspection to be fully integrated within coordinate measurement routines, making the CMM a "single platform" metrology system. Offering measurement capability of 6.3 to 0.05 Ra, the probe eliminates the need for handheld surface measurement devices or transporting workpieces to a dedicated surface measuring machine, reducing labor costs and inspec- tion lead times. The system allows automated switching between dimensional measurement and surface finish measurement, with the analysis contained in a single report. The probe is a fully integrated option for the Revo system, supplied with two dedicated styli, straight and cranked, which are selected via the measure- ment program control using the system's modular rack system. The probe incorporates a C axis that, combined with the infinite positioning of the Revo head and choice of stylus holders, enables the probe tip to be automatically oriented to virtually any angle to suit the workpiece, ensuring that the highest quality surface data is acquired. This enables flexible access to component features, combined with the consistency of fully automated CNC control. Using the straight stylus, the SFP1 can perform a measurement trace within a 10-mm- diameter bore to a depth of 100 mm. A skidded probe with a 2-micron-radius diamond stylus tip, the SFP1 out- puts Ra, RMS and raw data formats to the metrology application software via Renishaw's UCCServer software. The raw data can subsequently be presented to specialized surface analysis software for more detailed reporting. Callibration of the probe also is automated under the CMM program. A surface finish callibration artifact is mounted on the MRS rack and is mea- sured using the probe. Software then adjusts parameters within the probe in accordance with the artifact's callibrated value. Renishaw Inc. / 847-286-9953 / renishaw.com Compact CMM Provides Accuracy to 0.7 Micron Mitutoyo America's Strato-Apex 574 coordinate measuring machine is a com- pact bridge-type design featuring accuracy as low as 0.7 micron, utilizing a 0.05-micron resolution scale and temperature range of 18-22°C (64.4-71.6°F). This model is well-suited for manufacturers of high-precision small parts for industries such a medical, precision mold and aerospace that require a smaller footprint for CMM inspection. The Strato-Apex line offers a specially designed machine body with rigid structure, a precision guide mechanism and precise crystallized glass scales with near-zero thermal expansion, and incorporates compensation technol- ogy. A standard vibration-dampening unit also is included. The CMMs also feature dual joysticks, an air-balanced Z-axis ram, precision air bearings on all axes, a USB, fully digital DC 32-bit Mitutoyo CNC CMM digital signal processor controller and a PH10MQ quill-mounted probe head featuring internal wiring. A range of inspections solutions including scanning probe, non-contact laser scanning, video and surface roughness inspection also can be added. Mitutoyo America Corp. / 630-820-9666 / mitutoyo.com